Arbitrary-Precision Signal Generation for Bandlimited Mixed-Signal Testing

This paper presents significant improvements in the generation of analog signals for on-chip analog circuit testing. In particular, the novel oscillators proposed here can achieve signal-to-noise ratios far greater than previous designs, while remaining area-efficient. One particular example illustrates a 30 dB improvement in the SNR. Alternatively, signals can be generated with the same SNR as with older designs but over a wider range of frequencies. Multitone signal generation is enhanced in the same fashion. Prototypes were built and satisfactorily tested on FPGA technology.